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Electron Microscopy and Instrumentation
MJ Engineering Solutions provided precision engineering support for electron microscope camera filter, including subsystem design, mechanical integration, prototyping, and validation. Our work supports high-stability TEM/SEM imaging platforms used in research, material science, and advanced instrumentation.
Selected Project Examples
Electron Microscope Filter for TEM/SEM Imaging System
Designed and integrated a precision slit mechanical subsystem supporting electron microscopy imaging. The system required to stand high voltage, high vacuum and high positional accuracy, repeatability, resolution and manufacturable assembly methods.
Engineering Responsibilities
• System-level opto-mechanical design and architecture
• CAD modeling and detailed drawings
• Tolerance analysis and stack-up verification
• Prototype build support and debugging
• Validation testing and design refinement
• Manufacturing handoff documentation
